Surface-Ionization Drift-Spectrometry is devoted to a new drift-spectrometry method using surface ionization of nitrogen-, phosphorus-, arsenic- and sulfur-containing organics. New theoretical approaches are described that successfully combine a surface-ionization source and a drift spectrometer of coaxial type to obtain multi-parameter detection of organic molecules in a single instrument. This reference examines various versions of the device and the model set of nitrogen, phosphorus, arsenic and sulfur-containing organics result in successful identification of three to seven independent parameters. The authors demonstrate the methods versatility in identifying multiple parameters for electronic materials and devices. Additional features include: Demonstrates a new approach to Time-of-Flight Ion Mobility Spectrometry (TFIMS). Explores alternative methods for High-field Asymmetric Waveform Ion Mobility Spectrometry (FAIMS). Offers readers greater multi-parameter identification, selectivity, and resistance to fluctuations in humidity. About the Author: Vladimir I. Kapustin, Professor, Russian Technological University, Moscow, RU Alexey P. Korzhavyi, Professor, Bauman Moscow State Technical University, Moscow, RU